Brunco, D.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Short-channel epitaxial germanium pMOS transistors

G. Eneman, B. De Jaeger, G. Wang, J. Mitard, G. Hellings, D.P. Brunco, E. Simoen, R. Loo, M. Caymax, C. Claeys, K. De Meyer, M. Meuris, M.M. Heyns

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 323 KB

english, 2010

2

[IEEE 2019 Device Research Conference (DRC) - Ann Arbor, MI, USA (2019.6.23-2019.6.26)] 2019 Device Research Conference (DRC) - High Performance and Yield for Super Steep Retrograde Wells (SSRW) by Well Implant / Si-based Epitaxy on Advanced Technology FinFETs

Rana, U., Brunco, D. P., Raman, S., Triyoso, D.H., Stoker, M.W., Johnson, J. B., Pantisano, L., Seo, K. D., Zhao, M., Reznicek, A., Krishnan, R., Moser, B., Freeman, J., Jang, L., Kaganer, E.

Year:

2019

File:

PDF, 470 KB

2019

3

Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory

B. Govoreanu, D. Wellekens, L. Haspeslagh, D.P. Brunco, J. De Vos, D. Ruiz Aguado, P. Blomme, K. van der Zanden, J. Van Houdt

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 229 KB

english, 2008

4

Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks

Z. Li, T. Schram, L. Pantisano, A. Stesmans, T. Conard, S. Shamuilia, V.V. Afanasiev, A. Akheyar, S. Van Elshocht, D.P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, S. De Gendt, K. De Meyer

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 307 KB

english, 2007

5

Distribution and generation of traps in SiO2/Al2O3 gate stacks

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 129 KB

english, 2007

6

ZINClick: A Database of 16 Million Novel, Patentable, and Readily Synthesizable 1,4-Disubstituted Triazoles

Massarotti, Alberto, Brunco, Angelo, Sorba, Giovanni, Tron, Gian Cesare

Journal:

Journal of Chemical Information and Modeling

Year:

2014

Language:

english

File:

PDF, 3.08 MB

english, 2014

7

(Invited) Stress Simulations of Si- and Ge-Channel FinFETs for the 14 nm-Node and Beyond

Eneman, G., Brunco, D. P., Witters, L., Vincent, B., Favia, P., Hikavyy, A., De Keersgieter, A., Mitard, J., Loo, R., Veloso, A., Richard, O., Bender, H., Vandervorst, W., Caymax, M., Horiguchi, N., C

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 344 KB

english, 2013

8

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Etch Rates of Ge, GaAs and InGaAs in Acids, Bases and Peroxide Based Mixtures

Sioncke, Sonja, Brunco, David P., Meuris, Marc, Uwamahoro, Olivier, Van Steenbergen, Jan, Vrancken, Evi, Heyns, Marc M.

Year:

2008

Language:

english

File:

PDF, 343 KB

english, 2008

9

Stress Techniques and Mobility Enhancement in FinFET Architectures

Eneman, G., Witters, L., Mitard, J., Hellings, G., De Keersgieter, A., Brunco, D. P., Hikavyy, A., Vincent, B., Simoen, E., Favia, P., Bender, H., Veloso, A., Chiarella, T., Boccardi, G., Kim, M., Tog

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 579 KB

english, 2013

10

Materials and electrical characterization of molecular beam deposited CeO[sub 2] and CeO[sub 2]/HfO[sub 2] bilayers on germanium

Brunco, D. P., Dimoulas, A., Boukos, N., Houssa, M., Conard, T., Martens, K., Zhao, C., Bellenger, F., Caymax, M., Meuris, M., Heyns, M. M.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

11

Scaling to Sub-1 nm Equivalent Oxide Thickness with Hafnium Oxide Deposited by Atomic Layer Deposition

Delabie, Annelies, Caymax, Matty, Brijs, Bert, Brunco, David P., Conard, Thierry, Sleeckx, Erik, Van Elshocht, Sven, Ragnarsson, Lars-Åke, De Gendt, Stefan, Heyns, Marc M.

Journal:

Journal of The Electrochemical Society

Year:

2006

Language:

english

File:

PDF, 625 KB

english, 2006

12

Nonequilibrium partitioning during rapid solidification of SiAs alloys

J.A. Kittl, M.J. Aziz, D.P. Brunco, M.O. Thompson

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 845 KB

english, 1995

13

Defect engineering aspects of advanced Ge process modules

C. Claeys, E. Simoen, K. Opsomer, D.P. Brunco, M. Meuris

Journal:

Materials Science and Engineering: B

Year:

2008

Language:

english

File:

PDF, 1.63 MB

english, 2008

14

Profiling of traps in SiO2/Al2O3 gate stack by the charge pumping technique

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 132 KB

english, 2006

15

Influence of passivating interlayer on Ge/HfO2 and Ge/Al2O3 interface band diagrams

V.V. Afanas’ev, A. Stesmans, A. Delabie, F. Bellenger, M. Houssa, R.R. Lieten, C. Merckling, J. Penaud, D.P. Brunco, M. Meuris

Journal:

Materials Science in Semiconductor Processing

Year:

2008

Language:

english

File:

PDF, 394 KB

english, 2008

16

Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

E. Simoen, G. Brouwers, G. Eneman, M. Bargallo Gonzalez, B. De Jaeger, J. Mitard, D.P. Brunco, L. Souriau, N. Cody, S. Thomas, M. Meuris

Journal:

Materials Science in Semiconductor Processing

Year:

2008

Language:

english

File:

PDF, 298 KB

english, 2008

17

Scaling down the interpoly dielectric for next generation Flash memory: Challenges and opportunities

B. Govoreanu, D.P. Brunco, J. Van Houdt

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 299 KB

english, 2005

18

Germanium FETs and capacitors with rare earth CeO2/HfO2 gates

A. Dimoulas, Y. Panayiotatos, A. Sotiropoulos, P. Tsipas, D.P. Brunco, G. Nicholas, J. Van Steenbergen, F. Bellenger, M. Houssa, M. Caymax, M. Meuris

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 517 KB

english, 2007

19

Benefits and side effects of high temperature anneal used to reduce threading dislocation defects in epitaxial Ge layers on Si substrates

V. Terzieva, L. Souriau, M. Caymax, D.P. Brunco, A. Moussa, S. Van Elshocht, R. Loo, F. Clemente, A. Satta, Marc Meuris

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 589 KB

english, 2008

20

Boron doping of silicon by plasma source ion implantation

R.J. Matyi, D.L. Chapek, D.P. Brunco, S.B. Felch, B.S. Lee

Journal:

Surface and Coatings Technology

Year:

1997

Language:

english

File:

PDF, 665 KB

english, 1997

21

Is there an impact of threading dislocations on the characteristics of devices fabricated in strained-Ge substrates?

Eddy Simoen, Gijs Brouwers, Rui Yang, Geert Eneman, Mireia Bargallo Gonzalez, Frederick Leys, Brice De Jaeger, Jerome Mitard, David Brunco, Laurent Souriau, Nyles Cody, Shawn Thomas, Luc Lajaunie, Mar

Journal:

physica status solidi (c)

Year:

2009

Language:

english

File:

PDF, 450 KB

english, 2009

22

Overlapping and multi-touching text-line segmentation by Block Covering analysis

Abderrazak Zahour, Brunco Taconet, Laurence Likforman-Sulem, Wafa Boussellaa

Journal:

Pattern Analysis and Applications

Year:

2009

Language:

english

File:

PDF, 1.43 MB

english, 2009

23

Silicides and germanides for nano-CMOS applications

J.A. Kittl, K. Opsomer, C. Torregiani, C. Demeurisse, S. Mertens, D.P. Brunco, M.J.H. Van Dal, A. Lauwers

Journal:

Materials Science and Engineering: B

Year:

2008

Language:

english

File:

PDF, 2.33 MB

english, 2008

24

Interface engineering for Ge metal-oxide–semiconductor devices

A. Dimoulas, D.P. Brunco, S. Ferrari, J.W. Seo, Y. Panayiotatos, A. Sotiropoulos, T. Conard, M. Caymax, S. Spiga, M. Fanciulli, Ch. Dieker, E.K. Evangelou, S. Galata, M. Houssa, M.M. Heyns

Journal:

Thin Solid Films

Year:

2007

Language:

english

File:

PDF, 755 KB

english, 2007

25

Complete experimental test of kinetic models for rapid alloy solidification

J.A. Kittl, P.G. Sanders, M.J. Aziz, D.P. Brunco, M.O. Thompson

Journal:

Acta Materialia

Year:

2000

Language:

english

File:

PDF, 603 KB

english, 2000

26

Electrical characteristics of 8-/spl Aring/ EOT HfO/sub 2//TaN low thermal-budget n-channel FETs with solid-phase epitaxially regrown junctions

Ragnarsson, L.-A., Severi, S., Trojman, L., Johnson, K.D., Brunco, D.P., Aoulaiche, M., Houssa, M., Kauerauf, T., Degraeve, R., Delabie, A., Kaushik, V.S., De Gendt, S., Tsai, W., Groeseneken, G., Kri

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 539 KB

english, 2006

27

Germanium MOSFETs With CeO2/HfO2/ TiN Gate Stacks

Nicholas, G., Brunco, D.P., Dimoulas, A., Van Steenbergen, J., Bellenger, F., Houssa, M., Caymax, M., Meuris, M., Panayiotatos, Y., Sotiropoulos, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 380 KB

english, 2007

28

High-Performance Deep Submicron Ge pMOSFETs With Halo Implants

Nicholas, G., De Jaeger, B., Brunco, D.P., Zimmerman, P., Eneman, G., Martens, K., Meuris, M., Heyns, M.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 792 KB

english, 2007

29

Impact of Donor Concentration, Electric Field, and Temperature Effects on the Leakage Current in Germanium p n Junctions

Eneman, G., Wiot, M., Brugere, A., Casain, O.S.I., Sonde, S., Brunco, D.P., De Jaeger, B., Satta, A., Hellings, G., De Meyer, K., Claeys, C., Meuris, M., Heyns, M.M., Simoen, E.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 539 KB

english, 2008

30

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

Maji, D., Crupi, F., Amat, E., Simoen, E., De Jaeger, B., Brunco, D.P., Manoj, C.R., Rao, V.R., Magnone, P., Giusi, G., Pace, C., Pantisano, L., Mitard, J., Rodriguez, R., Nafria, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 344 KB

english, 2009

31

Quantification of Drain Extension Leakage in a Scaled Bulk Germanium PMOS Technology

Eneman, G., De Jaeger, B., Simoen, E., Brunco, D.P., Hellings, G., Mitard, J., De Meyer, K., Meuris, M., Heyns, M.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1016 KB

english, 2009

32

Germanium partitioning in silicon during rapid solidification

Brunco, D. P., Thompson, Michael O., Hoglund, D. E., Aziz, M. J., Gossmann, H.-J.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 1.35 MB

english, 1995

33

Etch Rate Study of Germanium, GaAs and InGaAs: A Challenge in Semiconductor Processing

Sioncke, Sonja, Brunco, David P., Meuris, Marc, Uwamahoro, Olivier, Van Steenbergen, Jan, Vrancken, Evi, Heyns, Marc M.

Journal:

Solid State Phenomena

Year:

2009

Language:

english

File:

PDF, 268 KB

english, 2009

34

Ruthenium gate electrodes on SiO[sub 2] and HfO[sub 2]: Sensitivity to hydrogen and oxygen ambients

L. Pantisano, T. Schram, Z. Li, J. G. Lisoni, G. Pourtois, S. De Gendt, D. P. Brunco, A. Akheyar, V. V. Afanas’ev, S. Shamuilia, A. Stesmans

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 528 KB

english, 2006

35

[IEEE 2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM) - Singapore, Singapore (2014.6.2-2014.6.4)] 2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM) - Impact of stressors in future SiGe-based FinFETs: Mobility boost and scalability

Eneman, G., Brunco, D.P., Witters, L., Mitard, J., Hikavyy, A., De Keersgieter, A., Roussel, P. J., Loo, R., Veloso, A., Horiguchi, N., Collaert, N., Thean, A.

Year:

2014

File:

PDF, 947 KB

2014

36

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Atomic Layer Deposition of High-k Dielectric Layers on Ge and III-V MOS Channels

Delabie, Annelies, Alian, A., Bellenger, Florence, Brammertz, Guy, Brunco, David P., Caymax, Matty, Conard, Thierry, Franquet, A., Houssa, Michel, Sioncke, Sonja, Van Elshocht, S., Van Hemmen, J. L.,

Year:

2008

Language:

english

File:

PDF, 605 KB

english, 2008

37

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Current Challenges in Ge MOS Technology

Dimoulas, Athanasios, Houssa, M., Ritenour, A., Fompeyrine, J., Tsai, W., Seo, J.W., Panayiotatos, Y., Tsipas, P., Brunco, David P., Caymax, Matty R., Locquet, J.-P., Dieker, Ch.

Year:

2006

Language:

english

File:

PDF, 513 KB

english, 2006

38

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Germanium: The Past and Possibly a Future Material for Microelectronics

Brunco, David P., De Jaeger, Brice, Eneman, Geert, Satta, Alessandra, Terzieva, Valentina, Souriau, Laurent, Leys, Frederik E., Pourtois, Geoffrey, Houssa, Michel, Opsomer, Karl, Nicholas, Gareth, Meu

Year:

2007

Language:

english

File:

PDF, 532 KB

english, 2007

39

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Alternative Gate Dielectric Materials

Van Elshocht, Sven, Hardy, An, De Gendt, S., Adelmann, Christophe, Baumann, Peter K., Brunco, David P., Caymax, Matty R., Conard, Thierry, Delugas, Pietro, Lehnen, Peer, Richard, Olivier, Rohr, Erika,

Year:

2006

Language:

english

File:

PDF, 260 KB

english, 2006

40

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Selective Epitaxial Growth of Germanium on Si Wafers with Shallow Trench Isolation: An Approach for Ge Virtual Substrates

Wang, Gang, Leys, Frederik E., Souriau, Laurent, Loo, Roger, Caymax, Matty, Brunco, David P., Geypen, Jef, Bender, Hugo, Meuris, Marc, Vandervorst, Wilfried, Heyns, Marc M.

Year:

2008

Language:

english

File:

PDF, 645 KB

english, 2008

41

[IEEE 2008 9th International Conference on Ultimate Integration on Silicon (ULIS) - Udine, Italy (2008.03.12-2008.03.14)] 2008 9th International Conference on Ultimate Integration of Silicon - Substrate bias effect on Ge pMOSFETs with and without halo

Simoen, E., Voroshazi, E., Mitard, J., Eneman, G., Brunco, D.P., De Jaeger, B., Meuris, M.

Year:

2008

Language:

english

File:

PDF, 129 KB

english, 2008

42

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Germanium FETs and capacitors with rare earth CeO2/HfO2 gates

Dimoulas, A., Panayiotatos, Y., Sotiropoulos, A., Tsipas, P., Brunco, D., Nicholas, G., Steenbergen, J., Bellenger, F., Houssa, M., Caymax, M., Meuris, M.

Year:

2006

Language:

english

File:

PDF, 836 KB

english, 2006

43

High Performance 70-nm Germanium pMOSFETs With Boron LDD Implants

Hellings, G., Hellings, G., Mitard, J., Mitard, J., Eneman, G., Eneman, G., Eneman, G., De Jaeger, B., Brunco, D.P., Shamiryan, D., Vandeweyer, T., Meuris, M., Heyns, M.M., Heyns, M.M., De Meyer, K.,

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 299 KB

english, 2009

44

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Alternative channel materials for MOS devices

Heyns, Marc, Adelmann, Christoph, Brammertz, Guy, Brunco, David, Caymax, Matty, De Jaeger, Brice, Delabie, Annelies, Eneman, Geert, Houssa, Michel, Lin, Dennis, Martens, Koen, Merckling, Clement, Meur

Year:

2008

Language:

english

File:

PDF, 1.01 MB

english, 2008

45

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Materials properties of B-doped Si by low energy plasma source ion implantation

Matyi, R.J., Brunco, D.P., Felch, S.B., Ishida, E., Larson, L., Wang, L., Wang, S.

Year:

1997

Language:

english

File:

PDF, 587 KB

english, 1997

46

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Al2O3 Based Flash Interpoly Dielectrics: a Comparative Retention Study

Wellekens, Dirk, Blomme, Pieter, Govoreanu, Bogdan, Vos, Joeri, Haspeslagh, Luc, Houdt, Jan, Brunco, David, Der Zanden, Koen

Year:

2006

Language:

english

File:

PDF, 742 KB

english, 2006

47

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Degradation and breakdown of 0.9 nm EOT SiO/sub 2/ ALD HfO/sub 2/metal gate stacks under positive constant voltage stress

Degraeve, R., Kauerauf, T., Cho, M., Zahid, M., Ragnarsson, L.A., Brunco, D.P., Kaczer, B., Roussel, Ph., De Gendt, S., Groeseneken, G.

Year:

2005

Language:

english

File:

PDF, 433 KB

english, 2005

48

[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Understanding the materials, electrical and reliability impact of Al-addition to ZrO2 for BEOL compatible MIM capacitors

Triyoso, Dina H., Chu, Sanford, Seidel, Konrad, Weinreich, Wenke, Kok-Yong Yiang,, Nolan, Mark G., Brunco, David P., Rinderknecht, Jochen, Utess, Dirk, Kyono, Carl, Miller, Rod, Jeasung Park,, Lili

Year:

2014

Language:

english

File:

PDF, 671 KB

english, 2014

49

[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - High Performance High-k/Metal Gate Ge pMOSFETs with gate lengths down to 125 nm and halo implant

De Jaeger, B., Nicholas, G., Brunco, D. P., Eneman, G., Meuris, M., Heyns, M. M.

Year:

2007

Language:

english

File:

PDF, 206 KB

english, 2007

50

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Formation of deep sub-micron buried channel pMOSFETs with plasma doping

Felch, S.B., Brunco, D.P., Lee, B.S., Ahmad, A., Prall, K., Chapek, D.L.

Year:

1997

Language:

english

File:

PDF, 418 KB

english, 1997